DZD450型真空包裝機設(shè)計含8張CAD圖

DZD450型真空包裝機設(shè)計含8張CAD圖,dzd450,真空,裝機,設(shè)計,cad Stresa, Italy, 25-27 April 2007 0-LEVEL VACUUM PACKAGING RT PROCESS FOR MEMS RESONATORS Nicolas Abelé1,3, Daniel Grogg1, Cyrille Hibert2, Fabrice Casset4, Pascal Ancey3, Adrian M. Ionescu1 1LEG, Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland, 2CMI (EPFL), 3ST Microelectronics, France, 4CEA-LETI MINATEC, France ABSTRACT A new Room Temperature (RT) 0-level vacuum package is demonstrated in this work, using amorphous silicon (aSi) as sacrificial layer and SiO2 as structural layer. The process is compatible with most of MEMS resonators and Resonant Suspended-Gate MOSFET [1] fabrication processes. This paper presents a study on the influence of releasing hole dimensions on the releasing time and hole clogging. It discusses mass production compatibility in terms of packaging stress during back-end plastic injection process. The packaging is done at room temperature making it fully compatible with IC-processed wafers and avoiding any subsequent degradation of the active devices. 1. INTRODUCTION MEMS resonators performances have been demonstrated to satisfy requirements for CMOS co-integrated reference oscillator applications [2-3]. Different packaging possibilities were proposed in previous years using either a 0-level approaches [4, 5] or wafer bonding approaches [6]. According to industry requirements, 0-level thin film packaging using standard front-end manufacturing processes is however likely to be the most cost-efficient technique to achieve vacuum encapsulation of MEMS components for volume production. 2. DEVICE DESCRIPTION AND PACKAGING DESIGN The packaging process has been done on a MEMS resonator having MOSFET detection [1]. The device is based on a suspended-gate resonating over a MOSFET channel which modulates the drain current. The advantage of this technique is the much larger the output detection current than for the usual capacitive detection type, due to the intrinsic gain of the transistor. The RSG-MOSFET device fabrication process and performances were previously described in [7]. The process steps are presented in Fig. 1, where a 5μm thick amorphous silicon (aSi) layer is sputtered on the already released MEMS resonator followed by a 2μm RF sputtered SiO2 film deposition. A quasi-zero stress aSi film deposition process has been developed; the quasi- vertical deposition avoids depositing material under the beam lowering the releasing time. Releasing holes of 1.5μm were etched through the SiO2 layer and the releasing step is done by dry SF6 plasma. Due to pure chemical etching, high selectivity of less than 1nm/min on SiO2 was obtained. The holes were clogged by a non- conformal sputters SiO2 deposition at room temperature. Fig. 1 Schematic of the 0-level vacuum package fabrication process of a RSG-MOSFET Packaging process has been performed on the metal-gate SG-MOSFET and Fig. 2a shows an SEM picture of a released AlSi-based RSG-MOSFET with a 500nm air- gap, a beam length and width of respectively 12.5μm and 6μm with a 40nm gate oxide. A vacuum packaged RSG- MOSFET is shown in Fig. 2b highlighting the strong bonds of the re-filled releasing hole after clogging. Cross section of a releasing hole in Fig. 2c shows more than 1μm bonding surface to ensure cavity sealing. A FIB cross section in Fig. 2d shows the suspended SiO2 ?EDA Publishing/DTIP 2007 ISBN: 978-2-35500-000-3 Nicolas Abelé, Daniel Grogg, Cyrille Hibert, Fabrice Casset, Pascal Ancey, Adrian M. Ionescu 0-LEVEL VACUUM PACKAGING RT PROCESS FOR MEMS RESONATORS membrane above the suspended-gate. The vacuum atmosphere inside the cavity is obtained by depositing the top SiO2 layer under 5x10-7mBar given by the equipment. Suspended- Gate Drain Source Bulk contact a) 10 μm Drain Source Suspended- Gate 6μm 1μm b) SiO2 c) 1μm Hole diameter 1.5μm Vacuumed cavity 1um SiO2 d) Drain Suspended- Gate 50μm Fig. 2 SEM pictures of a) AlSi-based RSG-MOSFET, b) Top view of a SiO2 cap covering the RSG-MOSFET, c) Cross section of releasing holes filled with sputtered SiO2, d) FIB cross section of the packaged RSG- MOSFET, material re-deposited during the FIB cut is surrounding the suspended-gate and the SiO2 membrane. The slightly compressive SiO2 membranes show very good behavior for the thin film packaging, as seen in Fig.3 where cavities were formed on large opening size. During the clogging process, due to the highly non- conformal deposition, the amount of material entering in the cavity has been measured to be only 80nm compared to the 2.5μm oxide deposited. Residues inside the cavity are confined in an 8-to-10μm diameter circle, but strongly depend on the topology inside the cavity. The oxide thickness needed to clog the holes strongly depends on the hole width-over-height ratio, which therefore determines the amount of residues in the cavity. 40μm SuspendedSiO2 membranes a) 2μm 1.1μm aSi0.5μm wet oxide 4.5μm sputtered SiO2 b) Fig. 3 a-b)Cross section of a 2um SiO2 suspended membrane having a releasing hole clogged by a 2.5μm SiO2 sputtering deposition 3. EFFECT OF OPENING SIZE ON RELEASING RATE AND CLOGGING EFFECT Etching rate variation on aSi related to the hole opening size and the aSi thickness is shown in Fig. 4. Small holes openings decrease the etching rate. A dual underetching behavior due to aSi thickness variation and holes diameters is observed after a 2 min. release step: for a small hole aperture (2μm diameter), exposed surface factor is dominant and etching rate is 3 times greater for the thin aSi. However for large openings (9μm diameter) for which underetch distance is more important, path factor representing the lateral opening height for species ?EDA Publishing/DTIP 2007 ISBN: 978-2-35500-000-3 Nicolas Abelé, Daniel Grogg, Cyrille Hibert, Fabrice Casset, Pascal Ancey, Adrian M. Ionescu 0-LEVEL VACUUM PACKAGING RT PROCESS FOR MEMS RESONATORS to reach aSi becomes important and then etching ratio decreases to 1.3. 0 1 2 3 4 5 6 1 2 3 4 5 6 7 8 9 10 Hole diameter (um) Un de re tc h r at e ( um /m in) 1.1um aSi 3.3 um aSi Fig. 4 Underetch rate for various releasing holes diameters with amorphous silicon sacrificial layers of 1.1μm and 3.3μm, after 2min. releasing. After release, encapsulation is performed by sputtered deposition of SiO2 under high vacuum of 5x10-7mbar using the intrinsic, non-conformal deposition to clog holes, as shown in Fig. 5. Clogging effect is strongly material dependent and is related to the sticking coefficient that defines probability for a molecule to stick to the surface. The coefficient is below 0.01 for LPCVD Poly-Si but 0.26 for SiO2, therefore being more suitable for clogging purpose. SiO2membrane 2μm Clogging Holeaperture SiO2redeposition Remaining aperture Fig. 5 Schematic of a cross section of the SiO2 membrane clogged by SiO2 sputtering deposition Hole clogging has a strong dependence on the opening aspect ratio as presented in Fig. 6. Holes with diameter- over-height aspect ratio below 1 are clogged for SiO2 thickness of 2μm. Hole with opening ratio of 1.5 could only be clogged for a 3μm thick SiO2 deposition. The hole clogging rate is measured to be 330nm per deposited micron of SiO2. 0 1000 2000 3000 4000 0 1 2 3 Opening aspect ratio Re m ain in g ap er tu re (n m ) 2μm SiO2 Initial SiO2 membrane thickness = 2μm 3μm SiO2 Re ma ini ng ap er tu re (n m) Fig. 6 hole clogging effect depending on the diameter- over-height ratio in the 2μm SiO2 membrane (Right). Remaining aperture diameter (in nm) for 2μm and 3μm SiO2 deposition for hole clogging. The effect of hole geometry on underetch rate and clogging has been studied on square and rectangular holes in Fig.7. Rectangular opening has a quasi identical underetching than square shape of the same opening area, while clogging is 10 times more important. 0 5 10 15 20 25 30 35 0 5 10 15 20 Relasing time (min) Un de re tc h ( um ) 2um 2um x etching direction y etching direction x y x x Fig. 7 Underetch length after 16min release for 29.1μm2 square and rectangle release holes (red dotted rectangles). The initial SiO2 thickness is a 2μm and the thickness of aSi is 1.1μm. Remaining hole size after 2.5μm SiO2 deposition is 1.4μm for the square and 140nm for the rectangle. 4. PACKAGING ISSUES FOR PRODUCTION ENVIRONMENT For industrial production of integrated MEMS, 0-level package has to sustain plastic molding, which corresponds to an isostatic pressure of around 100Bar. Encapsulation film thickness has been designed to lower the impact of the pressure during molding. FEM simulations done with Coventor? in Fig. 8 show that the ?EDA Publishing/DTIP 2007 ISBN: 978-2-35500-000-3 Nicolas Abelé, Daniel Grogg, Cyrille Hibert, Fabrice Casset, Pascal Ancey, Adrian M. Ionescu 0-LEVEL VACUUM PACKAGING RT PROCESS FOR MEMS RESONATORS molding-induced package deflection is reduced to 25nm, having a 4.5μm thick SiO2 film, which makes it compatible with standard industrial back-end processes. 0 1.5 13 19 25 nm Displacement: a) Coventor? 0 0.4 0.8 1.2 1.6 MPa Stress: b) Coventor? Fig. 8 FEM modelling of the packaged resonator under applied isostatic pressure mimicking plastic injection process step. Effect of LTO and PECVD nitride materials on capping deflection under molding stress are presented in Table I. Membrane thickness can then be optimized to lower the molding-induced deflection by considering Young’s modulus and maximum stress before failure of the two materials. Structural layer material LTO Nitride PECVD Film thickness 4.5μm 2.5μm Max. stress before failure 2GPa 9GPa Stress due to molding 1.6MPa 4MPa Molding-induced deflection 25nm 36nm Table I. FEM simulations of the structural layer thickness needed to sustain plastic molding over 0-level packaging composed of a 30μmx30μm membrane. Comparison with PECVD nitride thickness needed to induce the same deflection. On the developed process flow, further investigations on vacuum level and long term stability still to be studied in order to fully characterize the packaging. This characterization can either be done directly by using helium leakage test [9], or indirectly by actuating the packaged resonator for which quality factor is directly related to the vacuum level. 5. CONCLUSION A novel 0-level packaging process was presented using aSi as sacrificial layer and SiO2 as encapsulating layer. RSG-MOSFET resonators have been successfully encapsulated under high vacuum. Impact of back-end-of- line industrial process over the encapsulation has been investigated, resulting in optimal cover thickness needed to sustain plastic molding. Influence of hole dimensions on releasing time and clogging effect for encapsulation were investigated, and optimized packaging parameters are identified for this process. . 11. REFERENCES [1] N. Abelé et al., "Ultra-low voltage MEMS resonator based on RSG-MOSFET ", MEMS ’06, pp. 882-885, 2006 [2] V. Kaajakari et al., "Low noise silicon micromechanical bulk acoustic wave oscillator", IEEE International Ultrasonics Symposium, pp. 1299- 1302, 2005 [3] Y.-W. Lin et al., “Low phase noise array-composite micromechanical wine-glass disk oscillator,” IEDM ’05, pp. 287-290, 2005 [4] N. Sillon et al., Wafer Level Hermetic Packaging for Above-IC RF MEMS: Process and Characterization, IMAPS 2004 [5] B. Kim et al.,, "Frequency Stability of Wafer-Scale Encapsulated MEMS Resonators," Transducers '05, vol. 2, pp. 1965-1968, 2005 [6] V. Kaajakari et al., "Stability of wafer level vacuum encapsulated single-crystal silicon resonators", Sensors and Actuators A: Physical, Vol. 130-131, pp. 42-47, 2006 [7] N. Abelé et al., "Suspended-Gate MOSFET: bringing new MEMS functionality into solid-state MOS transistor ", IEDM ’05, LATE NEWS, pp. 479-481, 2005 [8] S. Frédérico et al.,”Silicon sacrificial layer dry etching (SSLDE) for free-standing RF MEMS architectures”, MEMS ’03, pp. 570- 573, 2003 [9] I. D. Wolf at al., "The Influence of the Package Environment on the Functioning and Reliability of Capacitive RF-MEMS Switches," Microwave Journal, vol. 48, pp. 102-116, 2005. ?EDA Publishing/DTIP 2007 ISBN: 978-2-35500-000-3